Used Keysight E4991A RF Impedance & Material Analyzer 1MHz-3GHz
$9,029.00
In Stock
Description
The E4991A RF impedance/material analyzer offers ultimate impedance measurement performance and powerful built in analysis function. It will provide innovations in R&D of components and circuit designers who evaluate components in the range of 3 GHz. The E4991A uses an RF-IV technique, as opposed to the reflection measurement technique, for more accurate impedance measurement over wide impedance range. Basic impedance accuracy is /-0.8%. High Q accuracy enables low-loss component analysis. The internal synthesizer sweeps frequency from 1 MHz to 3 GHz with 1 mHz resolution.
Basic Accuracy
- /- 0.8 % basic accuracy
Sweep Parameters
- Frequency: 1 MHz to 3 GHz
- Oscillator level: Up to 1 dBm/0.5 Vrms/10 mArms
- DC bias level (Option E4991A-001): /- 40V or /- 50 mA
More Features
- Windows-styled user interface
- Built-in VBA programming function
- Data transfer through LAN interface
Versatile Measurement Options
- Dielectric/magnetic material measurement (Option E4991A-002)
- Reliable on-wafer measurement (Option E4991A-010)
- Temperature characteristic measurement (Option E4991A-007)
Keysight E4991A RF Impedance Analyzer Specs
| Brand | Keysight |
| Model Number / SKU | E4991A |
| Country of Origin | Japan |
| Instrument Type | RF Impedance & Material Analyzer |
| Frequency Range | 1 MHz to 3 GHz |
| Frequency Resolution | 1 mHz |
| Frequency Stability | +/- 5 ppm |
| Analysis/Real-Time Bandwidth | Direct Impedance Analysis |
| DANL / Noise Floor | Basic Accuracy 0.8% |
| Phase Noise | N/A (Impedance Focus) |
| Maximum Input Power | +/- 40V DC Bias Support |
| VSWR / Return Loss | N/A |
| Impedance | 50 Ohm (Test Port) |
| Connector Type | 7 mm (APC-7) |
| Modulation Support | Dielectric/Magnetic Material Analysis |
| Interface/Connectivity | GPIB, LAN, USB |
| Display Type & Size | 8.4-inch Color LCD |
| Standard Warranty | 1 Year (Used) |
| Dimensions & Weight | 235 x 432 x 524 mm | 23 kg |
| Application | Surface-Mount Component Analysis and High-Frequency Material Characterization |
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