Tektronix 5-PWR Advanced Power Measurement & Analysis
Tektronix Series resolves common instrumentation bottlenecks during localized serial analysis configurations to secure absolute baseline data accuracy and minimize diagnostic overhead.
- Analysis support up to the limit of.
- Multi-channel Power Measurement Support Analog & Digital.
- Host Dependent Max Real-Time Sample.
- Hardware-accelerated Power Calculations Waveform Update Rate.
- Deep record capture for Inrush Current and.
$2,048.00
In Stock
Tektronix 5-PWR Metrology Specs
| Brand & Full Model SKU | Tektronix 5-PWR (Advanced Power Analysis Bundle) |
|---|---|
| Country of Origin | USA |
| Bandwidth & Rise Time | Analysis support up to the limit of the host MSO (max 2 GHz) |
| Analog & Digital Channels | Multi-channel Power Measurement Support |
| Max Real-Time Sample Rate | Host Dependent (Up to 6.25 GSa/s) |
| Waveform Update Rate | Hardware-accelerated Power Calculations |
| Max Memory Depth | Deep record capture for Inrush Current and Power Quality audits |
| Vertical Resolution & High-Res Mode | 12-bit ADC Precision for Loss Analysis |
| Input Sensitivity & Noise Floor | Automated Deskew for Current/Voltage Probes |
| Timebase Range & Jitter | Precise Phase Angle and Power Factor timing |
| Hardware-Based Triggers | Power-specific triggers (e.g., Safe Operating Area violations) |
| Protocol Analysis & Decoding | PMBus, SVID Decoding support [when combined with serial modules] |
| Spectral Analysis | Harmonics Analysis (up to 100th order), Total Harmonic Distortion (THD) |
| Display & UI Architecture | Dedicated Power Analysis Tab in MSO 5 Series UI |
| Connectivity & Interface | Software License for MSO 5 Series |
| Multi-Instrument Integration | Automated Pass/Fail testing for EN61000-3-2 Compliance |
| Standard Warranty & Service Interval | 90 Days Media Warranty (Software) | Lifetime entitlement for specific version |
| Metrological Compliance | NIST Traceable Analysis Algorithms |
| Industrial Application | Switching loss measurement, magnetic analysis, power quality audits, and GaN/SiC semiconductor characterization. |
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